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NY8320NSF/NY8320NSFP

High Tg, Low CTE and High modulus
Excellent heat resitance and Anti-CAF Performance
Superior PTH reliability and easy PCB processing
Halogen-Free

  • CPU、GPU.svg
    CPU/GPU
  • 应用处理器.svg
    Application processer
  • 闪存.svg
    NAND Flash
  • 手机动态内存.svg
    mDRAM
  • 射频系统级封装.svg
    RF SiP

NY8320NSF基板典型性能 Typical Properties for NY8320 NSF Laminate

PropertyItemIPC-TM-650Test ConditionUnitTypical Value
ThermalGlass Transition Temperature2.4.25DSC\
2.4.24TMA220~240
2.4.24.4DMA260~290 
(1078×2)
X/Y-axis CTE
2.4.24.5<Tg,TMAppm/°C 5
(2116×8)
Z-axis CTE
2.4.24<Tg,TMAppm/°C 10
>Tg,TMAppm/°C 55
2.4.2450~260℃%0.4~0.6
Decomposition Temperature2.4.24.6TGA(5%W.L)430
Thermal Resistance2.4.24.1CladMin>60
EtchedMin>60
Electrical(R/C:50%)
Permittivity
1MHz2.5.5.9C-24/23/50\
1GHz4.3
10GHzSPDR method4.1
(R/C:50%)
Loss Tangent
1MHz2.5.5.9C-24/23/50\
1GHz0.006
10GHzSPDR method0.007
Volume Resistivity2.5.17.1C-96/35/90MΩ-cm1.0×109
Surface ResistivityMΩ1.0×108
PhysicalWater Absorption2.6.2.1E-1/105+D-24/23%0.11
(HTE)
 Peel Strength
Toz2.4.8As ReceivedN/mm\
(RTF)
 Peel Strength
Toz\
(VLP)
 Peel Strength
Toz0.7
Flexural ModulusGB / T 9341-2018@RTGpa31\32
Young's ModulusGB / T 1040.1-2018@RTGpa31\32
Flame ResistanceUL-94A&E-4/125V-0


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